Digital integrated circuits: a design perspective
Digital integrated circuits: a design perspective
ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
Fundamentals of modern VLSI devices
Fundamentals of modern VLSI devices
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Technology and design challenges for low power and high performance
ISLPED '99 Proceedings of the 1999 international symposium on Low power electronics and design
Optimization of VDD and VTH for low-power and high speed applications
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Towards an energy complexity of computation
Information Processing Letters - Special issue in honor of Edsger W. Dijkstra
Robust subthreshold logic for ultra-low power operation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on low power electronics and design
Energy-delay efficiency of VLSI computations
Proceedings of the 12th ACM Great Lakes symposium on VLSI
Low Power Digital CMOS Design
Proceedings of the 2002 international symposium on Low power electronics and design
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Power-Constrained Microprocessor Design
ICCD '02 Proceedings of the 2002 IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD'02)
Optimal Supply and Threshold Scaling for Subthreshold CMOS Circuits
ISVLSI '02 Proceedings of the IEEE Computer Society Annual Symposium on VLSI
Proceedings of the 41st annual Design Automation Conference
Balancing hardware intensity in microprocessor pipelines
IBM Journal of Research and Development
Power-Delay Metrics Revisited for 90nm CMOS Technology
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Low Voltage, Low Power VLSI Subsystems
Low Voltage, Low Power VLSI Subsystems
Hi-index | 0.00 |
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for high-performance VLSI design. Consequently, enhancing processing performance is no longer the most important factor that dominates future circuit design considerations. This paper, for the first time, proposes a systematic methodology to determine a generalized design optimization metric for simultaneously trading-off power and performance in nanometer scale integrated circuits to achieve design-specific targets. The methodology incorporates interconnect effects as well as electrothermal couplings between substrate temperature, power, and performance for nanometer scale design optimization. Implications of choosing a specific design optimization metric on power, performance, and operating temperature are illustrated and discussed. The proposed methodology is shown to provide a more meaningful optimization metric (for power-performance tradeoff analysis) and basis, with considerations of chip-level thermal management including maximum allowable operating temperature and packaging/cooling solutions. Furthermore, implications of CMOS technology scaling and parameter variations on the proposed methodology are discussed.