An investigation of the impact of technology scaling on power wasted as short-circuit current in low voltage static CMOS circuits

  • Authors:
  • A. Chatterjee;M. Nandakumar;I. Chen

  • Affiliations:
  • Semiconductor Process and Device Center, Texas Instruments, P.O. Box 655012, M/S 461, Dallas, TX;Semiconductor Process and Device Center, Texas Instruments, P.O. Box 655012, M/S 461, Dallas, TX;Semiconductor Process and Device Center, Texas Instruments, P.O. Box 655012, M/S 461, Dallas, TX

  • Venue:
  • ISLPED '96 Proceedings of the 1996 international symposium on Low power electronics and design
  • Year:
  • 1996

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Abstract