Full-chip leakage current estimation based on statistical sampling techniques

Authors:
Shaobo Liu;Qinru Qiu;Qing Wu
Affiliations:
Binghamton University, State University of New York, Binghamton, USA;Binghamton University, State University of New York, Binghamton, USA;Binghamton University, State University of New York, Binghamton, USA
Venue:
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Year:
2008

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Abstract

In this paper, we propose statistical sampling techniques in estimating the mean and distribution of full-chip leakage current under process variations. The stratified random sampling procedures are used to estimate the mean and variance of the full-chip leakage, under intra-die and inter-die process variations. Statistical quantile estimation method is then applied to estimate the cumulative distribution function. Experimental results show that, comparing to simple random sampling, the proposed approaches improve the estimation speed by 2.7X, on average.