Fundamentals of modern VLSI devices
Fundamentals of modern VLSI devices
Technology and design challenges for low power and high performance
ISLPED '99 Proceedings of the 1999 international symposium on Low power electronics and design
Effectiveness of reverse body bias for leakage control in scaled dual Vt CMOS ICs
ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
Subthreshold leakage modeling and reduction techniques
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Proceedings of the 40th annual Design Automation Conference
Full chip leakage estimation considering power supply and temperature variations
Proceedings of the 2003 international symposium on Low power electronics and design
Statistical estimation of leakage current considering inter- and intra-die process variation
Proceedings of the 2003 international symposium on Low power electronics and design
Proceedings of the 2003 international symposium on Low power electronics and design
Statistical analysis of subthreshold leakage current for VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Parametric yield estimation considering leakage variability
Proceedings of the 41st annual Design Automation Conference
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
Proceedings of the 41st annual Design Automation Conference
Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Proceedings of the 2004 international symposium on Low power electronics and design
Full-chip analysis of leakage power under process variations, including spatial correlations
Proceedings of the 42nd annual Design Automation Conference
An Ultra Low Power System Architecture for Sensor Network Applications
Proceedings of the 32nd annual international symposium on Computer Architecture
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions
Proceedings of the 43rd annual Design Automation Conference
Analysis and modeling of subthreshold leakage of RT-components under PTV and state variation
Proceedings of the 2006 international symposium on Low power electronics and design
CASES '06 Proceedings of the 2006 international conference on Compilers, architecture and synthesis for embedded systems
Prediction of leakage power under process uncertainties
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Modeling and estimation of full-chip leakage current considering within-die correlation
Proceedings of the 44th annual Design Automation Conference
Timing variation-aware high-level synthesis
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Full-chip leakage current estimation based on statistical sampling techniques
Proceedings of the 18th ACM Great Lakes symposium on VLSI
A probabilistic technique for full-chip leakage estimation
Proceedings of the 13th international symposium on Low power electronics and design
Impact of Process and Temperature Variations on Network-on-Chip Design Exploration
NOCS '08 Proceedings of the Second ACM/IEEE International Symposium on Networks-on-Chip
Timing variation-aware task scheduling and binding for MPSoC
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Full-chip model for leakage-current estimation considering within-die correlation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Statistical leakage estimation based on sequential addition of cell leakage currents
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Variation-aware system-level power analysis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
PATMOS'06 Proceedings of the 16th international conference on Integrated Circuit and System Design: power and Timing Modeling, Optimization and Simulation
APPLE: adaptive performance-predictable low-energy caches for reliable hybrid voltage operation
Proceedings of the 50th Annual Design Automation Conference
Variation-aware leakage power model extraction for system-level hierarchical power analysis
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Leak-Gauge: A late-mode variability-aware leakage power estimation framework
Microprocessors & Microsystems
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The driving force for the semiconductor industry growth has been the elegant scaling nature of CMOS technology. In future CMOS technology generations, supply and threshold voltages will have to continually scale to sustain performance increase, control switching power dissipation, and maintain reliability. These continual scaling requirements on supply and threshold voltages pose several technology and circuit design challenges. With threshold voltage scaling sub-threshold leakage power is expected to become a significant portion of the total power in future CMOS systems. Therefore, it becomes crucial to predict sub-threshold leakage power of such systems. In this paper, we present a sub-threshold leakage power prediction model that takes into account within-die threshold voltage variation. Statistical measurements of 32-bit microprocessors in 0.18 mm CMOS confirms that the mean error of the model to be 4%. Comparisons of this model to two other existing models that do not take within-die threshold voltage variation into account are also presented.