Ten lectures on wavelets
VLSI implementation of discrete wavelet transform
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Fault Detection and Location Using IDD Waveform Analysis
IEEE Design & Test
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Parameter variations and impact on circuits and microarchitecture
Proceedings of the 40th annual Design Automation Conference
Dynamic Supply Current Testing of Analog Circuits Using Wavelet Transform
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
A tunable gm-C filter with low variation across Process, Voltage and Temperature
VLSID '04 Proceedings of the 17th International Conference on VLSI Design
A VLSI architecture for lifting-based forward and inverse wavelettransform
IEEE Transactions on Signal Processing
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Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that time-domain information obtained from wavelet analysis of supply current can be used to test the frequency specification of analog filters efficiently. The pole/zero locations in the frequency response of analog filters shift due to change in component values with process variations. It is essential to test the filters for the shift in frequency response and fix it during production test. Wavelet analysis of supply current can be a promising alternative to test frequency specification of analog filters, since it needs only one AC stimulus and is virtually unaffected by transistor threshold variation. Simulation results on two test circuits demonstrate that we can estimate pole/zero shift with less than 3% error using only one measurement, which requires about 18 measurements in the conventional technique.