IDDQ Defect Detection in Deep Submicron CMOS ICs

Leakage Current in Sub-Quarter Micron MOSFET: A Perspective on Stressed Delta IDDQ Testing

Journal of Electronic Testing: Theory and Applications

Test Method Evaluation Experiments & Data

ITC '00 Proceedings of the 2000 IEEE International Test Conference

VARIANCE REDUCTION USING WAFER PATTERNS in IddQ DATA

ITC '00 Proceedings of the 2000 IEEE International Test Conference

A Compact Built-In Current Sensor for IDDQ Testing

IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)

IDDX-based test methods: A survey

ACM Transactions on Design Automation of Electronic Systems (TODAES)

IDDQ data analysis using neighbor current ratios

Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Desing and test of systems on a chip