Built-in Current Sensor for "I{DDQ} Testing of Deep Submicron Digital CMOS ICs
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Exploiting Resonant Behavior to Reduce Inductive Noise
Proceedings of the 31st annual international symposium on Computer architecture
A Novel On-Chip Amplifier for Fast IDD Current Monitoring
Analog Integrated Circuits and Signal Processing
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