LEAP: An Accurate Defect-Free IDDQ Estimator
Journal of Electronic Testing: Theory and Applications
IDDQ Testing: Issues Present and Future
IEEE Design & Test
CMOS IC reliability indicators and burn-in economics
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Production-Oriented Measurement Method for Fast and Exhaustive Iddq Tests
EDTC '97 Proceedings of the 1997 European conference on Design and Test
LEAP: An Accurate Defect-Free IDDQ Estimator
ETW '00 Proceedings of the IEEE European Test Workshop
New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss
VLSID '03 Proceedings of the 16th International Conference on VLSI Design
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Improved Wafer-level Spatial Analysis for IDDQ Limit Setting
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Practical Built-In Current Sensor for IDDQ Testing
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Intrinsic Leakage in Low Power Deep Submicron CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Experiences with Implementation of IDDQ Test for Identification and Automotive Products
ITC '97 Proceedings of the 1997 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Graphical IDDQ signatures reduce defect level and yield loss
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Estimation of fault-free leakage current using wafer-level spatial information
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Hi-index | 0.00 |