Detection of Defects Using Fault Model Oriented Test Sequences
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Defect level prediction for I_DDQ testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Revisiting the Classical Fault Models through a Detailed Analysis of Realistic Defects
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Defect classes - an overdue paradigm for CMOS IC testing
ITC'94 Proceedings of the 1994 international conference on Test
Back annotation of physical defects into gate-level, realistic faults in digital ICs
ITC'94 Proceedings of the 1994 international conference on Test
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