Screening MinVDD Outliers Using Feed-Forward Voltage Testing

Authors:
R. Madge;B. H. Goh;V. Rajagopalan;C. Macchietto;R. Daasch;C. Schuermyer;C. Taylor;D. Turner
Affiliations:
-;-;-;-;-;-;-;-
Venue:
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Year:
2002

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Abstract

MinVDD testing using full vector set search routines consume too much test time.A 3-step process is proposed using (1) a reduced vector set (RVS) binary search to measure the intrinsic (defect free) MinVDD fora die, (2) a feed-forward to the full vector set (FVS) for Low Voltage testing and (3) Delta VDD and Nearest Neighbor Residual Statistical Post-Processing (SPP) are applied to the data to screen the MinVDD outliers that are identified using the RVS binary search.RVS vs.FVS correlation data is shown on 3 products. Data shows minVDD yield fall out of 0.2-0.8% and 20% of the minVDD outliers shows significant VDD shifts in burn-in.