Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs

Authors:
Robert Madge;Brady R. Benware;W. Robert Daasch
Affiliations:
-;-;-
Venue:
IEEE Design & Test
Year:
2003

Citing 11
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Abstract

Editor's note: Structured delay tests have been around for years, but how effectively do they identify defective silicon, even at reduced frequency? How much overkill is associated with their use? The authors present data from industrial circuits aimed at these and other aspects of speed testing.驴Ken Butler, Texas Instruments