Functional Constraints vs. Test Compression in Scan-Based Delay Testing

Authors:
Ilia Polian;Hideo Fujiwara
Affiliations:
Institute of Computer Science, Albert-Ludwigs-University, Freiburg im Breisgau, Germany 79110;Graduate School of Information Science, Nara Institute of Science and Technology, Nara, Japan
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2007

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Abstract

We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many positions as possible unspecified in order to facilitate test compression. The method is independent of the employed delay fault model, ATPG algorithm and test compression technique, and it is easy to integrate into an existing flow. Experimental results emphasize the severity of overtesting in scan-based delay test. Influence of different functional constraints on the amount of the required test data and the compression efficiency is investigated. To the best of our knowledge, this is the first systematic study on the relationship between overtesting prevention and test compression.