A Novel Transition Fault ATPG That Reduces Yield Loss

Authors:
Xiao Liu;Michael S. Hsiao
Affiliations:
Texas Instruments;Virginia Polytechnic Institute and State University
Venue:
IEEE Design & Test
Year:
2005

Citing 11
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Abstract

Transition delay tests are crucial to finding ICs with timing defects, but they can also find functionally untestable timing-related faults, thus reducing yield. This article describes an ATPG with constraints that prevent it from using the illegal states that lead to this overtesting.