Layout-aware pseudo-functional testing for critical paths considering power supply noise effects

Authors:
Xiao Liu;Yubin Zhang;Feng Yuan;Qiang Xu
Affiliations:
The Chinese University of Hong Kong, Shatin, N.T., Hong Kong;The Chinese University of Hong Kong, Shatin, N.T., Hong Kong;The Chinese University of Hong Kong, Shatin, N.T., Hong Kong;The Chinese University of Hong Kong, Shatin, N.T., Hong Kong
Venue:
Proceedings of the Conference on Design, Automation and Test in Europe
Year:
2010

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Abstract

When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of the circuits. In this paper, we propose novel layout-aware pseudo-functional testing techniques to tackle the above problem. Firstly, by taking the circuit layout information into account, functional constraints related to delay faults on critical paths are extracted. Then, we generate functionally-reachable test cubes for every true critical path in the circuit. Finally, we fill the don't-care bits in the test cubes to maximize power supply noises on critical paths under the consideration of functional constraints. The effectiveness of the proposed methodology is verified with large ISCAS'89 benchmark circuits.