Transition delay fault test pattern generation considering supply voltage noise in a SOC design
Proceedings of the 44th annual Design Automation Conference
A Methodology for Handling Complex Functional Constraints for Large Industrial Designs
Journal of Electronic Testing: Theory and Applications
Improving the transition fault coverage of functional broadside tests by observation point insertion
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
On systematic illegal state identification for pseudo-functional testing
Proceedings of the 46th Annual Design Automation Conference
Functional broadside tests under an expanded definition of functional operation conditions
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Layout-aware pseudo-functional testing for critical paths considering power supply noise effects
Proceedings of the Conference on Design, Automation and Test in Europe
On reset based functional broadside tests
Proceedings of the Conference on Design, Automation and Test in Europe
On timing-independent false path identification
Proceedings of the International Conference on Computer-Aided Design
Journal of Electronic Testing: Theory and Applications
Built-in generation of functional broadside tests using a fixed hardware structure
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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In designs using DFT such as scan some of the faults that are untestable in the circuit without DFT become testable after DFT insertion. Additionally, scan tests may scan in illegal or unreachable states that cause non-functional operation of the circuit during test. This may cause higher than normal power dissipation and demands on supply current. We propose new techniques to determine illegal states of circuits that can be used during ATPG to prohibit tests using such states. The resulting tests are essentially functional or pseudo-functional.