On applying incremental satisfiability to delay fault testing
DATE '00 Proceedings of the conference on Design, automation and test in Europe
False-Path Removal Using Delay Fault Simulation
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
Path delay fault testing using test points
ACM Transactions on Design Automation of Electronic Systems (TODAES)
9.2 On Delay-Untestable Paths and Stuck-Fault Redundancy
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Selection of Potentially Testable Path Delay Faults for Test Generation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
MUST: Multiple-Stem Analysis for Identifying Sequentially Untestable Faults
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Using BDDs and ZBDDs for Efficient Identification of Testable Path Delay Faults
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Path delay test compaction with process variation tolerance
Proceedings of the 42nd annual Design Automation Conference
Towards finding path delay fault tests with high test efficiency using ZBDDs
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
A Novel Transition Fault ATPG That Reduces Yield Loss
IEEE Design & Test
On effective criterion of path selection for delay testing
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Implicit identification of non-robustly unsensitizable paths
ICC'07 Proceedings of the 11th Conference on Proceedings of the 11th WSEAS International Conference on Circuits - Volume 11
On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation
Journal of Electronic Testing: Theory and Applications
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