Solving the incremental satisfiability problem
Journal of Logic Programming
Generation of high quality non-robust tests for path delay faults
DAC '94 Proceedings of the 31st annual Design Automation Conference
A satisfiability-based test generator for path delay faults in combinational circuits
DAC '96 Proceedings of the 33rd annual Design Automation Conference
GRASP—a new search algorithm for satisfiability
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Fast identification of untestable delay faults using implications
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Efficient Identification of Non-Robustly Untestable Path Delay Faults
Proceedings of the IEEE International Test Conference
Delay Testing for Non-Robust Untestable Circuits
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
SATO: An Efficient Propositional Prover
CADE-14 Proceedings of the 14th International Conference on Automated Deduction
A Method for Identifying Robust Dependent and Functionally Unsensitizable Paths
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Using CSP look-back techniques to solve real-world SAT instances
AAAI'97/IAAI'97 Proceedings of the fourteenth national conference on artificial intelligence and ninth conference on Innovative applications of artificial intelligence
Boolean satisfiability in electronic design automation
Proceedings of the 37th Annual Design Automation Conference
Using SAT for combinational equivalence checking
Proceedings of the conference on Design, automation and test in Europe
SATIRE: a new incremental satisfiability engine
Proceedings of the 38th annual Design Automation Conference
On Solving Stack-Based Incremental Satisfiability Problems
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics
Journal of Electronic Testing: Theory and Applications
Testability driven statistical path selection
Proceedings of the 48th Design Automation Conference
Incremental compilation-to-SAT procedures
SAT'04 Proceedings of the 7th international conference on Theory and Applications of Satisfiability Testing
Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Capturing post-silicon variation by layout-aware path-delay testing
Proceedings of the Conference on Design, Automation and Test in Europe
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