Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults

Authors:
Arijit Mondal;P. P. Chakrabarti;Pallab Dasgupta
Affiliations:
Indian Institute of Technology Kharagpur;Indian Institute of Technology Kharagpur;Indian Institute of Technology Kharagpur
Venue:
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Year:
2012

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Abstract

We present a symbolic-event-propagation-based scheme to generate hazard-free tests for robust path delay faults. This approach identifies all robustly testable paths in a circuit and the corresponding complete set of test vectors. We address the problem of finding a minimal set of test vectors that covers all robustly testable paths. We propose greedy and simulated-annealing-based algorithms to find the same. Results on ISCAS89 benchmark circuits show a considerable reduction in test vectors for covering all robustly testable paths.