Delay fault test generation for scan/hold circuits using Boolean expressions
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
The interdependence between delay-optimization of synthesized networks and testing
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
NEST: A non-enumerative test generation method for path delay faults in combinational circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Delay fault coverage and performance tradeoffs
DAC '93 Proceedings of the 30th international Design Automation Conference
An efficient non-enumerative method to estimate path delay fault coverage
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
ATPG tools for delay faults at the functional level
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Path delay fault testing using test points
ACM Transactions on Design Automation of Electronic Systems (TODAES)
ATPG for Path Delay Faults without Path Enumeration
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
Symbolic-Event-Propagation-Based Minimal Test Set Generation for Robust Path Delay Faults
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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