Delay fault test generation for scan/hold circuits using Boolean expressions

RESIST: a recursive test pattern generation algorithm for path delay faults

EURO-DAC '94 Proceedings of the conference on European design automation

BiTeS: a BDD based test pattern generator for strong robust path delay faults

EURO-DAC '94 Proceedings of the conference on European design automation

Fast identification of robust dependent path delay faults

DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference

Path delay ATPG for standard scan design

EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation

A satisfiability-based test generator for path delay faults in combinational circuits

DAC '96 Proceedings of the 33rd annual Design Automation Conference

Delay fault coverage: a realistic metric and an estimation technique for distributed path delay faults

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design

A Scan-BIST Structure to Test Delay Faults in Sequential Circuits

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Ordered Binary Decision Diagrams and Minimal Trellises

IEEE Transactions on Computers

ATPG tools for delay faults at the functional level

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Path delay fault testing using test points

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Test Generation for Path Delay Faults Using Binary Decision Diagrams

IEEE Transactions on Computers

Testability forecasting for sequential circuits

ATS '95 Proceedings of the 4th Asian Test Symposium

Bit parallel test pattern generation for path delay faults

EDTC '95 Proceedings of the 1995 European conference on Design and Test

An efficient automatic test generation system for path delay faults in combinational circuits

VLSID '95 Proceedings of the 8th International Conference on VLSI Design

An optimized BIST test pattern generator for delay testing

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

On path delay testing in a standard scan environment

ITC'94 Proceedings of the 1994 international conference on Test