Delay fault test generation for scan/hold circuits using Boolean expressions
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
NEST: A non-enumerative test generation method for path delay faults in combinational circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Fastpath: A Path-Delay Test Generator for Standard Scan Designs
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Design for Testability: Using Scanpath Techniques for Path-Delay Test and Measurement
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Skewed-Load Transition Test: Part 1, Calculus
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Skewed-Load Transition Test: Part 2, Coverage
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Transition path delay faults: a new path delay fault model for small and large delay defects
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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