Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
Delay fault test generation for scan/hold circuits using Boolean expressions
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
DAC '94 Proceedings of the 31st annual Design Automation Conference
Dynamic variable ordering for ordered binary decision diagrams
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
CATAPULT: concurrent automatic testing allowing parallelization and using limited topology
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
DYNAMITE: an efficient automatic test pattern generation system for path delay faults
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
ATPG tools for delay faults at the functional level
DATE '99 Proceedings of the conference on Design, automation and test in Europe
ATPG tools for delay faults at the functional level
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Path delay fault testing using test points
ACM Transactions on Design Automation of Electronic Systems (TODAES)
ATPG for Path Delay Faults without Path Enumeration
ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design
MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics
Journal of Electronic Testing: Theory and Applications
Identification of delay measurable PDFs using linear dependency relationships
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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