Identification of delay measurable PDFs using linear dependency relationships

Authors:
Edward Flanigan;Spyros Tragoudas
Affiliations:
Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL;Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
2010

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Abstract

Recently several methods have been presented to measure the delay of a small set of path delay faults (PDFs), known as a basis set which is used to compute the delays of PDFs. All methods assume that the basis consists of strong robustly tested PDFs because their delays can be measured. This paper presents procedures to identify measurable PDFs whose delays otherwise could not be measured by traditional strong robust sensitization. Path measurement techniques that conditer the bounded delay model allow us to compute the delays of almost all PDFs in existing benchmarks.