Critical path analysis using a dynamically bounded delay model

  • Authors:
  • Soha Hassoun

  • Affiliations:
  • Tufts University, Medford, MA

  • Venue:
  • Proceedings of the 37th Annual Design Automation Conference
  • Year:
  • 2000

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Abstract

This paper focuses on static timing analysis in the presence of capacitive coupling. We propose a novel gate delay model, the dynamically bounded delay model. In contrast to the min-max or bounded delay model which assumes a fixed delay range, [dmin, dmax], for each circuit component, our new model allows for the specification of delay variations and the conditions upon which the variations will hold. Novel static timing analysis algorithms can thus dynamically bound the delays. To demonstrate the effectiveness of this model and approach, we use our model to perform critical path analysis in the presence of capacitive coupling. Our experiments show that our approach avoids pessimism when compared to PERT analysis assuming worst case capacitive coupling.