Coupling delay optimization by temporal decorrelation using dual threshold voltage technique

  • Authors:
  • Ki-Wook Kim;Seong-Ook Jung;Taewhan Kim;Prashant Saxena;C. L. Liu;Sung-Mo Kang

  • Affiliations:
  • Brocade Communications Systems Inc., San Jose, CA;T-RAM Inc., San Jose, CA;Department of Electrical Engineering and Computer Science and AlTrc, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 305-701 Korea;Intel Corporation, Hillsboro, OR;National Tsing Hua University, Hsinchu 300, Taiwan, R.O.C.;School of Engineering, University of California at Santa Cruz, Santa Cruz, CA

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power
  • Year:
  • 2003

Quantified Score

Hi-index 0.00

Visualization

Abstract

Coupling effect due to line-to-line capacitance is of serious concern in timing analysis of circuits in ultra deep submicrometer CMOS technology. Often coupling delay is heavily dependent on temporal correlation of signal switching in relevant wires. Temporal decorrelation by shifting timing window can alleviate performance degradation induced by fight coupling. This paper presents an algorithm for minimizing circuit delay through timing window modulation in dual Vt technology. Experimental results on the ISCAS85 benchmark circuits indicate that the critical delay will be reduced significantly when low Vt is applied properly.