Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs

Aggressor alignment for worst-case coupling noise

ISPD '00 Proceedings of the 2000 international symposium on Physical design

Fault modeling and simulation for crosstalk in system-on-chip interconnects

ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design

All digital built-in delay and crosstalk measurement for on-chip buses

DATE '00 Proceedings of the conference on Design, automation and test in Europe

Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines

IEEE Transactions on Computers

Current Directions in Automatic Test-Pattern Generation

Computer

Coupling delay optimization by temporal decorrelation using dual threshold voltage technique

Proceedings of the 38th annual Design Automation Conference

Miller factor for gate-level coupling delay calculation

Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design

Test Generation for Crosstalk-Induced Faults: Framework and Computational Results

Journal of Electronic Testing: Theory and Applications

TA-PSV—Timing Analysis for Partially Specified Vectors

Journal of Electronic Testing: Theory and Applications

On-line detection of logic errors due to crosstalk, delay, and transient faults

ITC '98 Proceedings of the 1998 IEEE International Test Conference

Test generation in VLSI circuits for crosstalk noise

ITC '98 Proceedings of the 1998 IEEE International Test Conference

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on system-level interconnect prediction (SLIP)

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Closed-Form Crosstalk Noise Delay Metrics

Analog Integrated Circuits and Signal Processing

Using Temporal Constraints for Eliminating Crosstalk Candidates for Design and Test

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

DELAY-FAULT TESTING AND DEFECTS IN DEEP SUB-MICRON ICS - DOES CRITICAL RESISTANCE REALLY MEAN ANYTHING?

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Identification of Crosstalk Switch Failures in Domino CMOS Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Analysis of Interconnect Crosstalk Defect Coverage of Test Sets

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Delay Testing Considering Crosstalk-Induced Effects

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Crosstalk Test Generation on Pseudo industrial Circuits: A Case Study

ITC '01 Proceedings of the 2001 IEEE International Test Conference

On Reducing the Target Fault List of Crosstalk-Induced Delay Faults in Synchronous Sequential Circuits

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Coupling Noise Analysis for VLIS and ULSI Circuits

ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design

Test Generation for Crosstalk-Induced Delay in Integrated Circuits

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Self-Checking Scheme for Very Fast Clocks' Skew Correction

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Maximizing throughput over parallel wire structures in the deep submicrometer regime

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Coupling delay optimization by temporal decorrelation using dual threshold voltage technique

IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special section on low power

On Modeling Cross-Talk Faults

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1

An empirical study of crosstalk in VDSM technologies

GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI

Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults

IEEE Design & Test

STAX: statistical crosstalk target set compaction

Proceedings of the conference on Design, automation and test in Europe: Designers' forum

Crosstalk Induced Fault Analysis and Test in DRAMs

Journal of Electronic Testing: Theory and Applications

Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults

Proceedings of the conference on Design, automation and test in Europe

MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs

Journal of Electronic Testing: Theory and Applications

IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection

Journal of Electronic Testing: Theory and Applications

Addressing library creation challenges from recent Liberty extensions

Proceedings of the 45th annual Design Automation Conference

On ATPG for multiple aggressor crosstalk faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

High-quality pattern selection for screening small-delay defects considering process variations and crosstalk

Proceedings of the Conference on Design, Automation and Test in Europe

a fuzzy model for path delay fault detection

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

A unified detection scheme for crosstalk effects in interconnection bus

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Test generation for crosstalk-induced delay faults in VLSI circuits using modified FAN algorithm

VLSI Design