An analytical method for finding the maximum crosstalk in lossless-coupled transmission lines
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
A new gate delay model for simultaneous switching and its applications
Proceedings of the 38th annual Design Automation Conference
High Speed VLSI Interconnections: Modeling, Analysis, and Simulation
High Speed VLSI Interconnections: Modeling, Analysis, and Simulation
Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs
Proceedings of the IEEE International Test Conference
Test generation in VLSI circuits for crosstalk noise
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A new framework for static timing analysis, incremental timing refinement, and timing simulation
ATS '00 Proceedings of the 9th Asian Test Symposium
2.3 Automatic Test Pattern Generation for Crosstalk Glitches in Digital Circuits
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Generation for Crosstalk-Induced Delay in Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Modeling and extraction of interconnect capacitances for multilayer VLSI circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Selection of Crosstalk-Induced Faults in Enhanced Delay Test
Journal of Electronic Testing: Theory and Applications
Simulation-based ATPG for low power testing of crosstalk delay faults in asynchronous circuits
International Journal of Computer Applications in Technology
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Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. These noise effects can propagate through a circuit and create a logic error in a latch or at a primary output. We have developed a mixed-signal test generator, called XGEN, that incorporates classical static values as well as dynamic signals such as transitions and pulses, and timing information such as signal arrival times, rise/fall times, and gate delay. In this paper we first discuss the general framework of the test generation algorithm followed by computational results. Comparison of results with SPICE simulations confirms the accuracy of this approach.