Accurate interconnect modeling: towards multi-million transistor chips as microwave circuits
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Evaluation of interconnects with TDR (poster paper)
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines
IEEE Transactions on Computers
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Journal of Electronic Testing: Theory and Applications
On-line detection of logic errors due to crosstalk, delay, and transient faults
ITC '98 Proceedings of the 1998 IEEE International Test Conference
The effect of spot defects on the parametric yield of long interconnection lines
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Losses in Multilevel Crossover in VLSI Interconnects
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Structural Test in a Board Self Test Environment
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Test Generation for Crosstalk-Induced Delay in Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
An energy-efficient temporal encoding circuit technique for on-chip high performance buses
GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits
Proceedings of the 19th ACM Great Lakes symposium on VLSI
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From the Publisher:High-Speed VLSI Interconnections is the first and only book of its kind. It focuses on a variety of numerical and computer techniques used for the modeling, analysis, and simulation of phenomena that have become major factors in the evolution of very high speed integrated circuit (VHSIC) technology. Separate chapters are devoted to: parasitic effects such as capacitances and inductances, crosstalk, propagation delays, and electro-migration-induced failure, all of which are associated with VLSI interconnections. The final chapter discusses three interconnection technologies that may shape the future of integrated circuits. Each chapter is self-contained and can be read independently but also functions as part of a coherent overall presentation. Several techniques are provided for the analysis of each interconnection characteristic, and numerous illustrations provide the results of computer simulations. Challenging exercises at the end of each chapter are designed to help students gain further insight into the material presented. End-of-chapter appendices contain source codes of several computer programs for simulating VLSI interconnections. An excellent graduate-level text, High-Speed VLSI Interconnections offers a clear and accessible presentation of information that is not otherwise available in book form. As a professional reference, it is an indispensable source for researchers and engineers who seek a fuller understanding of this complex subject. It will also be of immense help to chip designers in developing VLSI interconnections with reduced parasitics, crosstalk, delay, and failure.