Analytic Models for Crosstalk Delay and Pulse Analysis Under Non-Ideal Inputs
Proceedings of the IEEE International Test Conference
Journal of Electronic Testing: Theory and Applications
Low-overhead design technique for calibration of maximum frequency at multiple operating points
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Path-RO: a novel on-chip critical path delay measurement under process variations
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On-Chip Delay Measurement Based Response Analysis for Timing Characterization
Journal of Electronic Testing: Theory and Applications
Small delay testing for TSVs in 3-D ICs
Proceedings of the 49th Annual Design Automation Conference
In-situ method for TSV delay testing and characterization using input sensitivity analysis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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