Crosstalk Test Generation on Pseudo industrial Circuits: A Case Study

  • Authors:
  • Liang-Chi Chen;T. M. Mak;Melvin A. Breuer;Sandeep K. Gupta

  • Affiliations:
  • -;-;-;-

  • Venue:
  • ITC '01 Proceedings of the 2001 IEEE International Test Conference
  • Year:
  • 2001

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Abstract

In this paper we present data that validates the viability of auniversity prototype crosstalk ATPG system, XGEN, on realdesigns. We remodeled Intel circuits and performed testgeneration using actual parasitic data. A crosstalk ATPGimplementation flow was developed based on Intel tools.Validation results are shown for the modified circuits. Criticalissues for preserving accurate timing information and capturingcrosstalk effects are discussed.