Calculating worst-case gate delays due to dominant capacitance coupling

  • Authors:
  • Florentin Dartu;Lawrence T. Pileggi

  • Affiliations:
  • Carnegie Mellon University, Department of ECE, Pittsburgh, PA;Carnegie Mellon University, Department of ECE, Pittsburgh, PA

  • Venue:
  • DAC '97 Proceedings of the 34th annual Design Automation Conference
  • Year:
  • 1997

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Abstract

In this paper we develop a gate level model that allows us to determinethe best and worst case delay when there is dominant interconnectcoupling. Assuming that the gate input windows oftransition are known, the model can predict the worst and bestcase noise, as well as the worst and best case impact on delay. Thisis done in terms of a Ceff based gate model under general RCinterconnect loading conditions.