Timed pattern generation for noise-on-delay calculation

  • Authors:
  • Seung Hoon Choi;Kaushik Roy;Florentin Dartu

  • Affiliations:
  • Purdue University, West Lafayette, IN;Purdue University, West Lafayette, IN;Intel Corporation, Hillsboro, OR

  • Venue:
  • Proceedings of the 39th annual Design Automation Conference
  • Year:
  • 2002

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Abstract

Computing the noise on delay effects is required for all circuits from simple ASIC designs to microprocessors. Transistor-level simulation engines make accurate delay calculation affordable only if the number of simulation per stage is very small. We propose a solution that predicts the alignment of aggressor signals with respect to the victim signal to induce the worst-case noise effect on delay. The aggressor alignment can be used to setup a detailed simulation. The worst-case delay in the presence of noise is predicted within 5% error for more than 99% of the cases tested using an average of 1.27 simulations per stage transition.