Slope interconnect effort: gate-interconnect interdependent delay modeling for early CMOS circuit simulation

  • Authors:
  • Myeong-Eun Hwang;Seong-Ook Jung;Kaushik Roy

  • Affiliations:
  • Intel Corporation, Hillsboro, OR;Department of Electrical and Computer Engineering, Yonsei University, Seoul, Korea;Department Electrical and Computer Engineering, Purdue University, West Lafayette, IN

  • Venue:
  • IEEE Transactions on Circuits and Systems Part I: Regular Papers
  • Year:
  • 2009

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Abstract

We propose an analytical closed-form gate-interconnect interdependent delay model that accounts for the dynamic behavior of signal slope across different regions of operation. In the presence of interconnects, the gate driver influences the input slope of the driven wire affecting the interconnect delay, and the driven wire acts as a parasitic load to the driver affecting the gate delay. Hence, it is essential to consider their interdependence for an accurate estimation of the circuit delay. The proposed model converts a signal slope into its effective fan-out for a simple yet accurate delay estimation. Simulations show that, for ISCAS benchmark circuits, our framework exhibits an error of Vdd = 1.2 V and 4.8% at Vdd = 0.3 V.