On the relevance of wire load models
Proceedings of the 2001 international workshop on System-level interconnect prediction
Explicit gate delay model for timing evaluation
Proceedings of the 2003 international symposium on Physical design
Delay Testing Considering Crosstalk-Induced Effects
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Gate delay calculation considering the crosstalk capacitances
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
VGTA: Variation Aware Gate Timing Analysis
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Parameterized block-based non-gaussian statistical gate timing analysis
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Calculating the effective capacitance for the RC interconnect in VDSM technologies
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Effective analytical delay model for transistor sizing
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Sizing and placement of charge recycling transistors in MTCMOS circuits
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
IEEE Transactions on Circuits and Systems Part I: Regular Papers
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We describe an improved iterationless approach for computing the effective capacitance of an interconnect load at a driving gate output. The speed and accuracy of our approach makes it suitable for the analysis loop within performance-driven iterative layout optimization. We present an iterationless approach for computing the effective capacitance of an interconnect load at a gate output when the slew time is non-zero (i.e., a ramp). We then extend this effective capacitance algorithm to complex gates, i.e., channel-connected components. Preliminary experimental results using the new effective capacitance approach show that the resulting delay estimates are quite accurate -- within 15% of HSPICE-computed delays on data taken from a recent microprocessor design in 0.25um m$ CMOS technology. The improved driver model reduces the cell delay calculation errors to below 10%; this indicates that accurate modeling of effective capacitance is no longer the dominant source of errors in cell delay calculation.