Interconnect Delay and Slew Metrics Using the First Three Moments

Authors:
Jiaxing Sun;Yun Zheng;Qing Ye;Tianchun Ye
Affiliations:
Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China;CEC Huada Electronic Design Co., Ltd., Beijing, China;Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China;Institute of Microelectronics of Chinese Academy of Sciences, Beijing, China
Venue:
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
Year:
2005

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Abstract

Efficient and highly accurate interconnect delay and slew computation is critical for physical synthesis and static timing analysis. Elmore delay is simple and closed-form metric, but it has too low accuracy. Some higher order moments metrics such as AWE can have high accuracy, but we cannot afford their calculation speeds. In this paper we propose two closed-form delay metrics and two closed-from slew metrics using the first three moments, which can be used for both step input and ramp input.