A delay metric for RC circuits based on the Weibull distribution

  • Authors:
  • Frank Liu;Chandramouli Kashyap;Charles J. Alpert

  • Affiliations:
  • IBM Austin, Austin, TX;IBM Austin, Austin, TX;IBM Austin, Austin, TX

  • Venue:
  • Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 2002

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Abstract

Physical design optimizations such as placement, interconnect synthesis, oorplanning, and routing require fast and accurate analysis of RC networks. Because of its simple close form and fast evaluation, the Elmore delay metric has been widely adopted. The recently proposed delay metrics PRIMO and H-gamma match the rst three circuit moments to the probability density function of a Gamma statistical distribution. Although these methods demonstrate impressive accuracy compared to other delay metrics, their implementations tend to be challenging. As an alternative to matching to the Gamma distribution, we propose to match the rst two circuit moments to a Weibull distribution. The result is a new delay metric called Weibull based Delay (WED). The primary advantages of WED over PRIMO and H-gamma are its efciency and ease of implementation. Experiments show that WED is robust and has satisfactory accuracies at both near and far-end nodes.