An accurate slew metric for on-chip VLSI interconnect using Weibull distribution function

  • Authors:
  • Rajib Kar;Ashish K. Mal;Anup K. Bhattacharjee

  • Affiliations:
  • National Institute of Technology, Durgapur;National Institute of Technology, Durgapur;National Institute of Technology, Durgapur

  • Venue:
  • Proceedings of the International Conference on Advances in Computing, Communication and Control
  • Year:
  • 2009

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Abstract

Slew rate determines the ability of a device to handle the varying signals. Determination of the slew rate to a good proximity is thus essential for efficient design of high speed CMOS integrated circuits. This in turn estimates the output switching surges in the device. Interconnect slew has become a crucial bottleneck for any high density and high speed VLSI circuits. In this paper we have proposed an accurate and efficient model to compute the slew metric of on-chip interconnect of high speed CMOS VLSI deigns. Our slew metric is based on the weibull distribution function. Comparison of simulation results with other established models justifies the accuracy of our slew approach.