Delay and slew metrics using the lognormal distribution

  • Authors:
  • Charles J. Alpert;Frank Liu;Chandramouli Kashyap;Anirudh Devgan

  • Affiliations:
  • IBM Corp., Austin, TX;IBM Corp., Austin, TX;IBM Corp., Austin, TX;IBM Corp., Austin, TX

  • Venue:
  • Proceedings of the 40th annual Design Automation Conference
  • Year:
  • 2003

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Abstract

For optimizations like physical synthesis and static timing analysis, efficient interconnect delay and slew computation is critical. Since one cannot often afford to run AWE[12], constant time solutions are required. This work presents the first complete solution to closed form formulae for both delay and slew. Our metrics are derived from matching circuit moments to the lognormal distribution. From a single table, one can easily implement the metrics for delay and slew for both step and ramp inputs. Experiments validate the effectiveness of the metrics for nets from a real industrial design.