Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
PRIMO: probability interpretation of moments for delay calculation
DAC '98 Proceedings of the 35th annual Design Automation Conference
h-gamma: an RC delay metric based on a gamma distribution approximation of the homogeneous response
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Multipoint moment matching model for multiport distributed interconnect networks
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Model order-reduction of RC(L) interconnect including variational analysis
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Proceedings of the 37th Annual Design Automation Conference
The Chebyshev expansion based passive model for distributed interconnect networks
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Future performance challenges in nanometer design
Proceedings of the 38th annual Design Automation Conference
From blind certainty to informed uncertainty
Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems
Proceedings of the 2001 IEEE/ACM international conference on Computer-aided design
Spectral Polynomial Chaos Solutions of the Stochastic Advection Equation
Journal of Scientific Computing
Death, taxes and failing chips
Proceedings of the 40th annual Design Automation Conference
Delay and slew metrics using the lognormal distribution
Proceedings of the 40th annual Design Automation Conference
Modeling uncertainty in flow simulations via generalized polynomial chaos
Journal of Computational Physics
Prima: passive reduced order interconnect macromodeling algorithm
Prima: passive reduced order interconnect macromodeling algorithm
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Fast interval-valued statistical interconnect modeling and reduction
Proceedings of the 2005 international symposium on Physical design
Generation of design guarantees for interconnect matching
Proceedings of the 2006 international workshop on System-level interconnect prediction
A probabilistic analysis of pipelined global interconnect under process variations
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Variational Interconnect Delay Metrics for Statistical Timing Analysis
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Practical variation-aware interconnect delay and slew analysis for statistical timing verification
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
A framework for statistical timing analysis using non-linear delay and slew models
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Random sampling of moment graph: a stochastic Krylov-reduction algorithm
Proceedings of the conference on Design, automation and test in Europe
Statistical model order reduction for interconnect circuits considering spatial correlations
Proceedings of the conference on Design, automation and test in Europe
Analysis of Power Supply Noise in the Presence of Process Variations
IEEE Design & Test
Statistical analysis of RF circuits using combined circuit simulator-full wave field solver approach
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Stochastic extended Krylov subspace method for variational analysis of on-chip power grid networks
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Parameterized model order reduction via a two-directional Arnoldi process
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Fast variational interconnect delay and slew computation using quadratic models
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Is overlay error more important than interconnect variations in double patterning?
Proceedings of the 11th international workshop on System level interconnect prediction
Statistical modeling and analysis of chip-level leakage power by spectral stochastic method
Integration, the VLSI Journal
Proceedings of the 20th symposium on Great lakes symposium on VLSI
Performance-oriented parameter dimension reduction of VLSI circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Computation of joint timing yield of sequential networks considering process variations
PATMOS'07 Proceedings of the 17th international conference on Integrated Circuit and System Design: power and timing modeling, optimization and simulation
Uncertainty quantification for integrated circuits: stochastic spectral methods
Proceedings of the International Conference on Computer-Aided Design
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Deformations in interconnect due to process variations can lead to significant performance degradation in deep sub-micron circuits. Timing analyzers attempt to capture the effects of variation on delay with simplified models. The timing verification of RC or RLC networks requires the substitution of such simplified models with spatial stochastic processes that capture the random nature of process variations. The present work proposes a new and viable method to compute the stochastic response of interconnects. The technique models the stochastic response in an infinite dimensional Hilbert space in terms of orthogonal polynomial expansions. A finite representation is obtained by using the Galerkin approach of minimizing the Hilbert space norm of the residual error. The key advance of the proposed method is that it provides a functional representation of the response of the system in terms of the random variables that represent the process variations. The proposed algorithm has been implemented in a procedure called OPERA, results from OPERA simulations on commercial design test cases match well with those from the classical Monte Carlo SPICE simulations and from perturbation methods. Additionally OPERA shows good computational efficiency: speedup factor of 60 has been observed over Monte Carlo SPICE simulations.