Model order-reduction of RC(L) interconnect including variational analysis
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Impact of interconnect variations on the clock skew of a gigahertz microprocessor
Proceedings of the 37th Annual Design Automation Conference
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
STAC: statistical timing analysis with correlation
Proceedings of the 41st annual Design Automation Conference
Variational delay metrics for interconnect timing analysis
Proceedings of the 41st annual Design Automation Conference
Block-based Static Timing Analysis with Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
"AU: Timing Analysis Under Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Probabilistic interval-valued computation: representing and reasoning about uncertainty in dsp and vlsi design
Asymptotic probability extraction for non-normal distributions of circuit performance
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Interval-valued reduced order statistical interconnect modeling
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Stochastic analysis of interconnect performance in the presence of process variations
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
PRIMA: passive reduced-order interconnect macromodeling algorithm
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Interval-valued statistical modeling of oxide chemical-mechanical polishing
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Proceedings of the 43rd annual Design Automation Conference
Statistical model order reduction for interconnect circuits considering spatial correlations
Proceedings of the conference on Design, automation and test in Europe
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Correlated interval representations of range uncertainty offer an attractive solution for approximating computations on statistical quantities. The key idea is to use finite intervals to approximate the essential mass of a pdf as it moves through numerical operators; the resulting compact interval-valued solution can be easily interpreted as a statistical distribution and efficiently sampled. This paper describes improved interval-valued algorithms for AWE/PRIMA model order reduction for tree-structured interconnect with correlated $RLC$ parameter variations. By moving to a faster interval-valued linear solver based on path-tracing ideas, and making more optimal trade-offs between interval- and scalar-valued computations, we can extract delay statistics roughly 10X faster than a classical Monte Carlo simulation loop, with accuracy to within 5%.