Impact of interconnect variations on the clock skew of a gigahertz microprocessor

  • Authors:
  • Ying Liu;Sani R. Nassif;Lawrence T. Pileggi;Andrzej J. Strojwas

  • Affiliations:
  • Department of Electrical and Computer Engineering, Carnegie Mellon University, 5000 Forbes Ave., Pittsburgh, PA;IBM Austin Research Lab, 11400 Burnet Road, Austin, TX;Department of Electrical and Computer Engineering, Carnegie Mellon University, 5000 Forbes Ave., Pittsburgh, PA;Department of Electrical and Computer Engineering, Carnegie Mellon University, 5000 Forbes Ave., Pittsburgh, PA

  • Venue:
  • Proceedings of the 37th Annual Design Automation Conference
  • Year:
  • 2000

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Abstract

Due to the large die sizes and tight relative clock skew margins, the impact of interconnect manufacturing variations on the clock skew in today's gigahertz microprocessors can no longer be ignored. Unlike manufacturing variations in the devices, the impact of the interconnect manufacturing variations on IC timing performance cannot be captured by worst/best case corner point methods. Thus it is difficult to estimate the clock skew variability due to interconnect variations. In this paper we analyze the timing impact of several key statistically independent interconnect variations in a context-dependent manner by applying a previously reported interconnect variational order-reduction technique. The results show that the interconnect variations can cause up to 25% clock skew variability in a modern microprocessor design.