PiCAP: a parallel and incremental capacitance extraction considering stochastic process variation

  • Authors:
  • Fang Gong;Hao Yu;Lei He

  • Affiliations:
  • Los Angeles, CA;Berkeley Design Automation, Santa Clara, CA;Los Angeles, CA

  • Venue:
  • Proceedings of the 46th Annual Design Automation Conference
  • Year:
  • 2009

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Abstract

It is unknown how to include stochastic process variation into fast-multipole-method (FMM) for a full chip capacitance extraction. This paper presents a parallel FMM extraction using stochastic polynomial expanded geometrical moments. It utilizes multi-processors to evaluate in parallel for the stochastic potential interaction and its matrix-vector product (MVP) with charge. Moreover, a generalized minimal residual (GMRES) method with deflation is modified to incrementally consider the nominal value and the variance. The overall extraction flow is called piCAP. Experiments show that the parallel MVP in piCAP is up to 3X faster than the serial MVP, and the incremental GMRES in piCAP is up to 15X faster than non-incremental GMRES methods.