FastSies: a fast stochastic integral equation solver for modeling the rough surface effect

Authors:
Zhenhai Zhu;J. White
Affiliations:
Cadence Berkeley Labs, CA, USA;Dept. of Electr. Eng., California Univ., Riverside, CA, USA
Venue:
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Year:
2005

Citing 6
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Abstract

In this paper we describe several novel sparsification techniques used in a fast stochastic integral equation solver to compute the mean value and the variance of capacitance of 3D interconnects with random surface roughness. With the combination of these numerical techniques, the computational cost has been reduced from O(N/sup 4/) to O(Nlog/sup 2/(N)), where N is the number of panels used for the discretization of nominal smooth surfaces. Numerical experiments show that the proposed numerical techniques are accurate and efficient.