Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
The Wiener--Askey Polynomial Chaos for Stochastic Differential Equations
SIAM Journal on Scientific Computing
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
FastSies: a fast stochastic integral equation solver for modeling the rough surface effect
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Efficient statistical capacitance variability modeling with orthogonal principle factor analysis
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Proceedings of the conference on Design, automation and test in Europe
Principle Hessian direction based parameter reduction with process variation
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Variational capacitance modeling using orthogonal polynomial method
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Stochastic integral equation solver for efficient variation-aware interconnect extraction
Proceedings of the 45th annual Design Automation Conference
Proceedings of the conference on Design, automation and test in Europe
Practical, fast Monte Carlo statistical static timing analysis: why and how
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
A divide-and-conquer algorithm for 3-D capacitance extraction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Robust Extraction of Spatial Correlation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient sensitivity-based capacitance modeling for systematic and random geometric variations
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Statistical extraction and modeling of inductance considering spatial correlation
Analog Integrated Circuits and Signal Processing
Statistical full-chip total power estimation considering spatially correlated process variations
Integration, the VLSI Journal
Efficient variation-aware EM-semiconductor coupled solver for the TSV structures in 3D IC
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Uncertainty quantification for integrated circuits: stochastic spectral methods
Proceedings of the International Conference on Computer-Aided Design
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In this paper we present a continuous surface model to describe the interconnect geometric variation, which improves the currently used model for better accuracy while not increasing the number of variables. Based on it, efficient techniques are presented for chip-level capacitance extraction considering the window technique. The sparse-grid-based Hermite polynomial chaos combined with a novel weighted principle factor analysis is employed for intra-window extraction. Then, the inter-window capacitance covariance is calculated through matrix pseudo inverse. Numerical results validate the accuracy and efficiency of the proposed method, which is more than 50 times faster than the Monte-Carlo simulation with 10000 samples.