A sparse image method for BEM capacitance extraction
DAC '96 Proceedings of the 33rd annual Design Automation Conference
IES3: a fast integral equation solver for efficient 3-dimensional extraction
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
A multiscale method for fast capacitance extraction
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Electromagnetic parasitic extraction via a multipole method with hierarchical refinement
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Branch Merge Reduction of RLCM Networks
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Proceedings of the 42nd annual Design Automation Conference
Asymptotic probability extraction for non-normal distributions of circuit performance
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
A fast hierarchical algorithm for three-dimensional capacitance extraction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the conference on Design, automation and test in Europe
Handling partial correlations in yield prediction
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Variational capacitance modeling using orthogonal polynomial method
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Proceedings of the conference on Design, automation and test in Europe
Variational capacitance extraction of on-chip interconnects based on continuous surface model
Proceedings of the 46th Annual Design Automation Conference
Variational capacitance extraction and modeling based on orthogonal polynomial method
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient sensitivity-based capacitance modeling for systematic and random geometric variations
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Statistical extraction and modeling of inductance considering spatial correlation
Analog Integrated Circuits and Signal Processing
Statistical full-chip total power estimation considering spatially correlated process variations
Integration, the VLSI Journal
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Due to the ever-increasing complexity of VLSI designs and IC process technologies, the mismatch between a circuit fabricated on the wafer and the one designed in the layout tool grows ever larger. Therefore, characterizing and modeling process variations of interconnect geometry has become an integral part of analysis and optimization of modern VLSI designs. In this paper, we present a systematic methodology to develop a closed form capacitance model, which accurately captures the nonlinear relationship between parasitic capacitances and dominant global/local process variation parameters. The explicit capacitance representation applies the orthogonal principle factor analysis to greatly reduce the number of random variables associated with modeling conductor surface fluctuations while preserving the dominant sources of variations, and consequently the variational capacitance model can be efficiently utilized by statistical model order reduction and timing analysis tools. Experimental results demonstrate that the proposed method exhibits over 100/spl times/ speedup compared with Monte Carlo simulation while having the advantage of generating explicit variational parasitic capacitance models of high order accuracy.