A sparse image method for BEM capacitance extraction

  • Authors:
  • Byron Krauter;Yu Xia;Aykut Dengi;Lawrence T. Pileggi

  • Affiliations:
  • IBM Corp., 11400 Burnet Road, Austin, TX;AMD Corp., 5900 E. Ben White Blvd, Austin, TX;SEMATECH Inc., 2706 Montopolis Drive, Austin, TX;Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA

  • Venue:
  • DAC '96 Proceedings of the 33rd annual Design Automation Conference
  • Year:
  • 1996

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Abstract