Stochastic finite elements: a spectral approach
Stochastic finite elements: a spectral approach
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Journal of Computational Physics
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ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Algorithm 847: Spinterp: piecewise multilinear hierarchical sparse grid interpolation in MATLAB
ACM Transactions on Mathematical Software (TOMS)
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ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Efficient statistical capacitance variability modeling with orthogonal principle factor analysis
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
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Proceedings of the conference on Design, automation and test in Europe
Proceedings of the conference on Design, automation and test in Europe
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ASP-DAC '07 Proceedings of the 2007 Asia and South Pacific Design Automation Conference
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Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Rapid method to account for process variation in full-chip capacitance extraction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hermite Polynomial Based Interconnect Analysis in the Presence of Process Variations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Variational capacitance extraction of on-chip interconnects based on continuous surface model
Proceedings of the 46th Annual Design Automation Conference
PiCAP: a parallel and incremental capacitance extraction considering stochastic process variation
Proceedings of the 46th Annual Design Automation Conference
Variational capacitance extraction and modeling based on orthogonal polynomial method
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient sensitivity-based capacitance modeling for systematic and random geometric variations
Proceedings of the 16th Asia and South Pacific Design Automation Conference
Proceedings of the 16th Asia and South Pacific Design Automation Conference
A parallel and incremental extraction of variational capacitance with stochastic geometric moments
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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In this paper, we propose a novel statistical capacitance extraction method for interconnects considering process variations. The new method, called statCap, is based on the spectral stochastic method where orthogonal polynomials are used to represent the statistical processes in a deterministic way. We first show how the variational potential coefficient matrix is represented in a first-order form using Taylor expansion and orthogonal decomposition. Then an augmented potential coefficient matrix, which consists of the coefficients of the polynomials, is derived. After that, corresponding augmented system is solved to obtain the variational capacitance values in the orthogonal polynomial form. Experimental results show that our method is two orders of magnitude faster than the recently proposed statistical capacitance extraction method based on the spectral stochastic collocation approach and many orders of magnitude faster than the Monte Carlo method for several practical interconnect structures.