Numerical analysis: mathematics of scientific computing (2nd ed)
Numerical analysis: mathematics of scientific computing (2nd ed)
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Model order-reduction of RC(L) interconnect including variational analysis
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Impact of interconnect variations on the clock skew of a gigahertz microprocessor
Proceedings of the 37th Annual Design Automation Conference
Proceedings of the 40th annual Design Automation Conference
Time-Domain Simulation of Variational Interconnect Models
ISQED '02 Proceedings of the 3rd International Symposium on Quality Electronic Design
A Linear-Centric Simulation Framework for Parametric Fluctuations
Proceedings of the conference on Design, automation and test in Europe
Prima: passive reduced order interconnect macromodeling algorithm
Prima: passive reduced order interconnect macromodeling algorithm
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
STAC: statistical timing analysis with correlation
Proceedings of the 41st annual Design Automation Conference
Block-based Static Timing Analysis with Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
"AU: Timing Analysis Under Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Fast interval-valued statistical interconnect modeling and reduction
Proceedings of the 2005 international symposium on Physical design
Statistical crosstalk aggressor alignment aware interconnect delay calculation
Proceedings of the 2006 international workshop on System-level interconnect prediction
Parameterized block-based non-gaussian statistical gate timing analysis
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Statistical gate delay calculation with crosstalk alignment consideration
GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
Interval-valued statistical modeling of oxide chemical-mechanical polishing
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Statistical timing based on incomplete probabilistic descriptions of parameter uncertainty
Proceedings of the 43rd annual Design Automation Conference
Proceedings of the 43rd annual Design Automation Conference
Proceedings of the 43rd annual Design Automation Conference
Robust estimation of parametric yield under limited descriptions of uncertainty
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Random sampling of moment graph: a stochastic Krylov-reduction algorithm
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the 2008 Asia and South Pacific Design Automation Conference
Fast variational interconnect delay and slew computation using quadratic models
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Reachability analysis of large-scale affine systems using low-dimensional polytopes
HSCC'06 Proceedings of the 9th international conference on Hybrid Systems: computation and control
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We show how recent advances in the handling of correlated interval representations of range uncertainty can be used to predict the impact of statistical manufacturing variations on linear interconnect. We represent correlated statistical variations in RLC parameters as sets of correlated intervals, and show how classical model order reduction methods - AWE and PRIMA - can be re-targeted to compute interval-valued, rather than scalar-valued reductions. By applying a statistical interpretation and sampling to the resulting compact interval-valued model, we can efficiently estimate the impact of variations on the original circuit. Results show the technique can predict mean delay with errors between 5-10%, for correlated RLC parameter variations up to 35%.