Proceedings of the 40th annual Design Automation Conference
First-order incremental block-based statistical timing analysis
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Fast interval-valued statistical interconnect modeling and reduction
Proceedings of the 2005 international symposium on Physical design
Probabilistic interval-valued computation: representing and reasoning about uncertainty in dsp and vlsi design
Interval-valued reduced order statistical interconnect modeling
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Statistical delay computation considering spatial correlations
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Timing budgeting under arbitrary process variations
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
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Technology-oriented tools provide the raw data needed to optimize the fabrication process itself, and to predict problematic variational impacts on silicon design. Unfortunately, even in these physics-oriented tools, statistically uncertain quantities appear as crucial inputs. To date, Monte Carlo techniques have been the dominant solution method. We suggest an alternative in which uncertainties are represented as correlated intervals, and interval-valued computations replace the standard scalar operations in the numerical algorithm for the tool. We use an oxide chemical-mechanical polishing tool as an example, and show how to "retrofit" workable statistical models on top of the original algorithm. Accuracies to within /spl sim/1-10% of Monte Carlo simulation, and speedups of /spl sim/10-100X can be achieved, depending on whether we choose a formulation which emphasizes accuracy, or efficiency.