Getting to the bottom of deep submicron

  • Authors:
  • Dennis Sylvester;Kurt Keutzer

  • Affiliations:
  • University of California, Berkeley Electrical Engineering and Computer Sciences;University of California, Berkeley Electrical Engineering and Computer Sciences

  • Venue:
  • Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
  • Year:
  • 1998

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Abstract